Spiller 1972 multilayer X-ray mirror: alternating layers of high-Z (Mo, W, Ni) and low-Z (Si, C, B₄C) materials with layer-pair thickness d = λ/(2 sin θ) (Bragg condition) form a resonant Bragg reflector for X-rays at arbitrary incidence…
Spiller 1972 multilayer X-ray mirror: alternating layers of high-Z (Mo, W, Ni) and low-Z (Si, C, B₄C) materials with layer-pair thickness d = λ/(2 sin θ) (Bragg condition) form a resonant Bragg reflector for X-rays at arbitrary incidence…