XANES multiple-scattering: T = V/(1 − V·G₀) Neumann resolvent; EXAFS sin(2kR+2δ) envelope

Layer 1 — Physicsin the x-ray-physics subtree

XANES / EXAFS multiple-scattering framework — the canonical x-ray-absorption-spectroscopy analysis method for extracting local-structure information from near-edge (XANES) and extended (EXAFS) absorption modulations (Sayers, Stern & Lytle,…

Related concepts

Neumann resolvent for K=c const: R = c/(1-λc), Σ geometric exact
Neumann T = V/(1 − V·G₀); 3rd-order Taylor T ≈ V + V²·G₀ + V³·G₀²; EXAFS sinusoid

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